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Mots clés
Rutherford backscattering spectrometry RBS
Acoustic propreties of solid
27Ald p&α
Isotopic Tracing
AC susceptibility
Annealing
7630Lh
SiC
Nickel
Nuclear reaction analysis
Atomic Layer Deposition ALD
Capillary condensation
18O
Auger electron spectroscopy AES
17Op
XPS
Pulsed laser deposition
Alloys
Periodic multilayer
Oxygen deficiency
Density functional theory
Multilayer
15N
Magnetic semiconductors
Topological defects
Ferromagnetic resonance
Gallium oxide
Metal-insulator transition
Silica
Nitridation
Epitaxy
Thin film
Indium oxide
Topological insulators
Aluminium
Ageing
Evaluation
Sputtering
7550Pp
Magnetization curves
Defects
27Alda
7550Ee
Epitaxial growth
18O resonance
27Aldp
Channeling
8140Ef
Stable isotopic tracing
Zinc oxide
Ion beam analysis
ADSORPTION DESORPTION HYSTERESIS
Alloy
X-ray diffraction
Adsorption Isotherms
Aluminum
Adsorbed layers
13C
Raman spectroscopy
Photoluminescence
Silicon carbide
Nanoparticles
Low energy electron diffraction LEED
Hysteresis
Oxidation
HfO2
Magnetic anisotropy
Charge exchange
Silicon
RBS
AFM
Passivation
EPR
Ion implantation
Transparent conductive oxide TCO
Acoustic
Interface defects
Al2O3
GaMnAs
6855Jk
NRP
Silicon Carbide
Pb centers
Diffusion
Thin films
17Opp
PIXE
ALD
Kossel diffraction
3C-SiC
Nuclear resonance profiling NRP
Measurement
XRD
Gold
Nanostructures
17O
2H
Adsorption
Energy loss
Growth